Semiconductor processing station

ABSTRACT

A semiconductor processing station includes first and second chambers, and a cooling stage. The second chamber includes a cooling pipe disposed inside the second chamber, and an external pipe. The cooling pipe includes a first segment disposed along a sidewall of the second chamber, and a second segment disposed perpendicular to the first segment and located above a wafer carrier in the second chamber. An end of the second segment is connected to an end of the first segment. The external pipe is connected to the second segment distal from the end of the second segment to provide a fluid to flow through the cooling pipe from an exterior to an interior of the second chamber. The fluid discharges toward the wafer carrier through the first segment. The first chamber is surrounded by the second chamber and the cooling stage, and communicates between the cooling stage and the second chamber.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a divisional application of and claims the prioritybenefit of a prior application Ser. No. 16/159,709, filed on Oct. 14,2018. The prior application Ser. No. 16/159,709 is a divisionalapplication of and claims the priority benefits of U.S. application Ser.No. 15/009,833, filed on Jan. 29, 2016. The entirety of each of theabove-mentioned applications is hereby incorporated by reference hereinand made a part of this specification.

BACKGROUND

During semiconductor processes, wafers are treated or processed asdesired by a user. In some processes, the wafers will have undesirablyrough surfaces that include hillocks. The presence of hillocks is adefect in the wafers that may cause a metal to metal shortingphenomenon. Thus, the wafers may be annealed in order to enlarge themetal grain size in the wafers and avoid a hillock phenomenon. However,the anneal process towards the wafers does not always perform fast orefficiently enough and the hillock phenomenon may still be significant.It is important for the annealing process of the wafers to be fast andefficient in order to reduce the hillock phenomenon.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 is a schematic view of a chamber according to some embodiments ofthe disclosure.

FIG. 2 is a schematic top view of the chamber of FIG. 1.

FIG. 3 is a cross-sectional view of the chamber of FIG. 2 taken alongline A-A′.

FIG. 4 is a schematic top view of a semiconductor processing stationaccording to some embodiments of the disclosure.

FIG. 5 is a schematic front view of a wafer carrier according to someembodiments of the disclosure.

FIG. 6 is a flow chart of a semiconductor process according to someembodiments of the disclosure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

FIG. 1 is a schematic view of a chamber according to some embodiments ofthe disclosure. FIG. 2 is a schematic top view of the chamber of FIG. 1.FIG. 3 is a cross-sectional view of the chamber of FIG. 2 taken alongline A-A′. Referring to FIG. 1 to FIG. 3, a chamber 100 includes asidewall 110, a cooling pipe 120, and an external pipe 130. The coolingpipe 120 is disposed in the chamber 100, and includes a first segment122 extending along the sidewall 110 in a height direction of thechamber 100. In some embodiments, as seen in FIG. 1 to FIG. 3, theheight direction of the chamber 100 is the Y direction. However, thedisclosure is not limited thereto. The height direction of the chamber100 is direction in which the height of the chamber 100 is measured. TheY direction being the height direction of the chamber 100 is merelyexemplary and only used to better describe the exemplary embodiment. Thefirst segment 122 includes a plurality of purge nozzles 122 a. Thechamber 100 further includes the external pipe 130, extending fromoutside the chamber 100 to inside the chamber 100.

In some embodiments, as seen in FIG. 1 to FIG. 3, the cooling pipe 120further includes a second segment 124 having a first end 124 a and asecond end 124 b. The second segment 124 extends along a width directionof the chamber 100. The width direction, is for example, the Xdirection, but is merely exemplary and only used to better describe theexemplary embodiment. The first segment 122 of the cooling pipe 120 isdisposed below the second segment 124 of the cooling pipe 120 andconnected to the first end 124 a of the second segment 124. The externalpipe 130 is connected to the second segment 124 between the first end124 a and the second end 124 b, so as to provide a fluid to flow throughthe first segment 122 and the second segment 124 of the cooling pipe120. That is to say, the external pipe 130 with a portion outside thechamber 100 may be connected to the fluid source so as to provide thefluid to inside the chamber 100 and to the cooling pipe 120. In someembodiments, the fluid provided to the cooling pipe 120 is a coolinggas. The cooling gas may be any gas suitable to cool the chamber 100.However, the disclosure is not limited thereto. In some embodiments, thefluid may also be a cooling liquid, and may be any liquid suitable tocool the chamber 100.

In some embodiments, as seen in FIG. 3, the cooling pipe 120 furtherincludes a third segment 126 disposed below the second segment 124. Thethird segment 126 is connected to the second end 124 b of the secondsegment 124. The third segment 126 extends along the sidewall in theheight direction of the chamber 100 similar to the first segment 122 andincludes a plurality of purge nozzles 126 a. As seen in FIG. 3 of theembodiment, the first segment 122 and the third segment 126 of thecooling pipe 120 are disposed adjacent to different sides of the chamber100. In particular, the first segment 122 and the third segment 126 ofthe cooling pipe 120 are disposed adjacent to opposite sides of thechamber 100. However, the disclosure is not limited thereto. The firstsegment 122 and the third segment 126 do not have to be on oppositesides of the chamber 100, but may be on different sides of the chamber100 and still connected with the second segment 124 of the cooling pipe120. If the first segment 122 and the third segment 126 are not onopposite sides of the chamber 100, the second segment 124 may not bestraight, but may be bent according to the location of the first segment122 and the third segment 126.

In some embodiments, the chamber 100 is adapted to contain a wafercarrier 140. The wafer carrier 140 carries a plurality of wafers 142,and the wafers 142 are adapted to be cooled in the chamber 100. In FIG.1 and FIG. 2, only one wafer 142 is shown so as to better depict allelements of the chamber 100. In FIG. 3, the wafer carrier 140 is notshown in order to better illustrate the cooling pipe 120 and the chamber100. In some embodiments, multiple wafers 142 may be disposed in thewafer carrier 140. That is to say, the fluid flowing through the coolingpipe is adapted to cool the wafers 142 when the wafer carrier 140 is inthe chamber 100. In some embodiments, the purge nozzles 122 a of thefirst segment 122 of the cooling pipe 120 and the purge nozzles 126 a ofthe third segment of the cooling pipe 120 face inwards and away from thesidewall 110 so that the fluid provided by the external pipe 130 to thecooling pipe 120 outputs from the purge nozzles 122 a of the firstsegment 122 of the cooling pipe 120 and the purge nozzles 126 a of thethird segment of the cooling pipe 120. Since the purge nozzles 122 a andthe purge nozzles 126 a face inwards and away from the sidewall 110, thefluid is able to easily reach the wafers 142 of the wafer carrier 140and cool the wafers 142. That is to say, the purge nozzles 122 a and thepurge nozzles 126 a face away from the sidewall 110 and face towards thewafers 142 of the wafer carrier 140. However, the disclosure is notlimited thereto. The purge nozzles 122 a and the purge nozzles 126 a mayface in any direction within the chamber 100 as desired by the user. Insome embodiments, the user may not want the fluid to directly outputtowards the wafers 142, and so the purge nozzles 122 a and the purgenozzles 126 a may face in different directions not towards the wafers142. One of ordinary skill in the art may adjust the direction that thepurge nozzles 122 a and the purge nozzles 126 a face according to designrequirements.

In some embodiments, the second segment 124 of the cooling pipe 120includes a plurality of purge nozzles 124 c. The purge nozzles 124 cface inwards towards the wafers 142 of the wafer carrier 140 so that thefluid provided by the external pipe 130 to the second segment 124 of thecooling pipe outputs toward the inside of the chamber 100 and towardsthe wafers 142 of the wafer carrier 140. However, the disclosure is notlimited thereto. The purge nozzles 124 c may face in any directionwithin the chamber 100 as desired by the user. In some embodiments, theuser may not want the fluid to directly output towards the wafers 142,and so the purge nozzles 124 c may face in different directions nottowards the wafers 142. One of ordinary skill in the art may adjust thedirection that the purge nozzles 124 c face according to designrequirements. In addition, the fluid provided from the external pipe 130flows into the second segment 124 and then into the first segment 122and the third segment 126. It can be seen from the arrows of FIG. 3 thedirection that the fluid flows within the cooling pipe 120 and out ofthe purge nozzles 122 a, 124 c, 126 a. The arrows of the fluid shown inFIG. 3 are merely exemplary, and used to better describe an exemplaryembodiment of the fluid in the cooling pipe 120. The directions of thearrows of the fluid shown in FIG. 3 are not meant to limit thedisclosure.

In some embodiments, the purge nozzles 122 a, 124 c, 126 a are evenlydistributed entirely across the corresponding first segment 122, secondsegment 124, and third segment 126 so as to output the fluid todifferent parts of the wafer carrier 140. That is to say, the topportion, middle portion, and bottom portion of the wafer carrier 140carrying wafers 142 in different portions are able to be cooled by thefluid outputted from the purge nozzles 122 a, 124 c, 126 a. However, thedisclosure is not limited thereto. The distribution of the purge nozzles122 a, 124 c, 126 a may be adjusted according to design requirements.For example, if the user desires a specific portion of the wafer carrier140 to be cooled faster, such as the middle portion, then the purgenozzles 122 a and 126 a may be denser in the middle of the correspondingfirst segment 122 and third segment 126. The distribution of the purgenozzles 122 a, 124 c, 126 a do not have to be evenly distributedentirely across the corresponding first segment 122, second segment 124,and third segment 126. Rather, one of ordinary skill in the art mayadjust the distribution of the purge nozzles 122 a, 124 c, 126 aaccording to design requirements.

In some embodiments, by including the cooling pipe 120 within thechamber 100, the wafers 142 in the chamber 100 can be cooled faster.Thus, when the wafers 142 are annealed and the placed in the chamber 100to cool to reduce the hillock phenomenon, the faster cooling with thecooling pipe 120 can provide a faster and more efficient annealingprocess. The faster annealing process may improve the efficiency ofenlarging the metal grain sizes (for example copper grain sizes) of thewafers 142. Thus, the cooling effect provided by the cooling pipe 120improves the efficiency and speed of the annealing process, and thus thehillock phenomenon in the wafers 142 can also be greatly reduced.

FIG. 4 is a schematic top view of a semiconductor processing stationaccording to some embodiments of the disclosure. Referring to FIG. 4, asemiconductor processing station 200 includes a central transfer chamber210, a load lock chamber 220, and a cooling stage 230. The load lockchamber 220 is disposed adjacent to the central transfer chamber 210.The load lock chamber 220 is adapted to contain a wafer carrier (notshown) containing a plurality of wafers 222. The cooling stage 230 isdisposed adjacent to the load lock chamber 220 and the central transferchamber 210. The central transfer chamber 210 communicates between thecooling stage 230 and the load lock chamber 220 to transfer a wafer 222of the plurality of wafers 222 between the cooling stage 230 and theload lock chamber 220.

In some embodiments, the semiconductor processing station furtherincludes a platform 240 disposed adjacent to the central transferchamber 210. The platform 240 includes a plurality of processing modules242. The central transfer chamber 210 communicates between the platform240 and the load lock chamber 220 to transfer a wafer 222 between theplatform 240 and the load lock chamber 220. Specifically, the centraltransfer chamber 210 is disposed in the middle surrounded by the loadlock chambers 220 (two are shown), the cooling stages 230 (two areshown), and the platform 240 having the processing modules 242 (two areshown). The number of load lock chambers 220, the cooling stages 230,and the processing modules 242 are merely exemplary, and may be adjustedaccording to user requirements.

In some embodiments, the central transfer chamber 210 communicatesbetween the processing modules 242, the load lock chambers 220, and thecooling stages 230 through an interface robot 212 that moves around inthe central transfer chamber 210. The interface robot 212 may carry thewafer 222 to place the wafer 222 in one of the processing modules 242,the load lock chambers 220, and the cooling stages 230. In FIG. 4, eachof the processing modules 242, the load lock chambers 220, and thecooling stages 230 are shown carrying a wafer 222 for descriptivepurposes only, and are merely exemplary. While the semiconductorprocessing station 200 is running, sometimes each of the processingmodules 242, the load lock chambers 220, and the cooling stages 230 arenot carrying a wafer 222.

In some embodiments, the semiconductor processing station 200 includesan equipment front end module (EFEM) 250. The EFEM 250 includes aninterface module 254 and a plurality of load ports 252 (three are shownas an example). The load ports 252 are adapted to receive and carry aplurality of wafers 222. The interface module 254 of the EFEM 250communicates between the load ports 252 and the load lock chambers 220so as to transfer the wafers 222 between the load ports 252 and the loadlock chambers 220. The shapes of the elements of the semiconductorprocessing station 200 shown in FIG. 4 are merely exemplary, and areonly drawn to as an example for description purposes only. The shapesshown in FIG. 4 are not meant to limit the disclosure.

In some embodiments, the interface module 254 transfers the wafers 222from the load ports 252 to the corresponding load lock chambers 220. Thewafers 222 are to be processed in the processing modules 242. Thus, thecentral transfer chamber 210 with the interface robot 212 may carry awafer 222 to be processed from the load lock chamber 220 to theprocessing module 242. While, the wafer 222 is being processed, theinterface robot 212 may carry another wafer 222 to be processed from theload lock chamber 220 to another processing module 242. After the wafer222 is processed in the interface robot 212, the interface robot 212 mayretrieve the processed wafer 222 and carry the processed wafer 222 tothe cooling stage 230 for the processed wafer 222 to be cooled. Afterthe processed wafer 222 is cooled to a certain point, the interfacerobot 212 may move the processed wafer 222 from the cooling stage 230 tothe load lock chamber 220. The user may determine the point at which theprocessed wafer 222 is cooled enough to be moved to the load lockchamber 220. This process may be continued to as the interface robot 212moves wafers 222 from the load lock chamber 220 to the processingmodules 242 to be processed, and moves the processed wafers from theprocessing modules 242 to the cooling stage 230. Then, once the wafers222 on the cooling stage 230 are cooled, the interface robot 212 maymove the wafer 222 from the cooling stage 230 to the load lock chamber220. When the load lock chamber 220 is full of processed wafers 222, theinterface module 254 may transfer the processed wafers 222 to the loadport 252 to exit the semiconductor processing station 200.

In some embodiments, the cooling stage 230 is cooled prior to placing aprocessed wafer 222 onto the cooling stage 230. The cooling stage 230 iscooled by providing a fluid to flow around the cooling stage 230. Morespecifically, the cooling stage 230 may have cooling liquid flow belowthe cooling stage 230 so as to reduce the temperature of the coolingstage 230. Then, by placing the processed wafer 222 onto the coolingstage 230, the processed wafer 222 may also be cooled. The coolingliquid may continually flow below the cooling stage 230. One of ordinaryskill in the art may control the frequency and amount of cooling liquidflowing around or below the cooling stage 230.

In some embodiments, since the semiconductor processing station 200includes the cooling stage 230, when the wafers 222 are processed (forexample annealed) to reduce the hillock phenomenon, the faster coolingwith the cooling stage 230 can provide a faster annealing process. Thefaster annealing process may improve the efficiency of enlarging themetal grain sizes (for example copper grain sizes) of the wafers 222.The cooling effect provided by the cooling stage 230 improves theefficiency and speed of the annealing process, and thus the hillockphenomenon in the wafers 222 can also be greatly reduced.

In some embodiments, the load lock chamber 220 may be the chamber 100shown in FIG. 1 to FIG. 3. That is, the load lock chamber 220 may alsobe the chamber 100 including the cooling pipe 120 so as to further coolthe processed wafers 222 in addition to the cooling from the coolingstage 230. However, the disclosure is not limited thereto, and the loadlock chamber 220 may be a chamber without the cooling pipe 120.

FIG. 5 is a schematic front view of a wafer carrier according to someembodiments of the disclosure. Referring to FIG. 5, the wafer carrier300 includes a plurality of slots 310 and a plurality of wafers 320. Thewafer carrier 300 includes a height H, and there is a pitch P betweeneach of the wafers 320. The pitch P may be, for example, measured from atop surface of the wafer 320 to the top surface of the next wafer 320.The pitch P between each of the wafers 320 is the height H of the wafercarrier 300 divided by x. That is to say, in some embodiments the numberof slots 310 is greater than the number of wafers 320. For example, asseen in FIG. 5, the number of wafers 320 is four, and the number ofslots 310 is 24. Thus, the value of x is, for example, four or may beless than four in some embodiments depending on the number of wafers320. In some embodiments, the number of slots 310 may be 24, and thenumber of wafers 320 is nine. Thus, the value of x is, for example, nineor less than nine in some embodiments depending on the number of wafers320. However, the disclosure is not limited thereto, and the number ofslots 310 may also be the same as the number of wafers 320, or thenumber of wafers 320 may be adjusted to achieve the desired pitch P. Inaddition, the number of slots 310 may also be adjusted. In someembodiments, at least one wafer 320 is placed in the wafer carrier 300,and the value of x which determines the pitch P may be adjustedaccording to the number of wafers 320 in the wafer carrier 300. As thevalue of x is lower, the value of the pitch P is greater. The wafercarrier 300 may be the wafer carrier contained in the chamber 100 ofFIG. 1 to FIG. 3. Furthermore, the wafer carrier 300 may be the wafercarrier contained in the load lock chamber 220 of FIG. 4. By having thepitch P between the wafers 320 be the height H of the wafer carrier 300divided by x, then the wafers 320 can be cooled faster and moreefficiently in the chamber 100 or the load lock chamber 220. Therefore,when the wafer carrier 300 is contained in the chamber 100 of FIG. 1 toFIG. 3, the wafer carrier 300 may be cooled even faster because of thecooling pipe 120. In addition, when the wafer carrier 300 is containedin the load lock chamber 220, the wafers 320 may also be cooled by thecooling station 230 and then moved into the wafer carrier 300. In someembodiments, the wafer carrier 300 is contained in the chamber 100, andthe chamber 100 is the load lock chamber 220. That is to say, the wafers320 in the wafer carrier 300 may be cooled faster because of the pitch Pbetween the wafers 320, the cooling pipe 120, and the cooling stage 230of the semiconductor processing station 200. The faster cooling improvesthe efficiency and speed of the annealing process towards the wafer, andthus the hillock phenomenon in the wafers can also be greatly reduced.

FIG. 6 is a flow chart of a semiconductor process according to someembodiments of the disclosure. The semiconductor process is performed bythe semiconductor processing station 200, and the following steps areperformed. In step S102, a processed wafer 222 from the processingmodule 242 is retrieved. Next, in step S104, the processed wafer 222 iscooled by placing the processed wafer 222 onto the cooling stage 230.Prior to step S104, the cooling stage 230 may be cooled by providing afluid to flow around the cooling stage 230. The cooling process of thecooling stage 230 may be referred to in the above description, and willnot be repeated herein. Next, in step S106, the processed wafer 222 fromthe cooling stage 230 is moved into a wafer carrier disposed in the loadlock chamber 220. Next, step S102 to step S106 are repeated to retrieveand cool another processed wafer 222.

After step S106, when the processed wafers 222 are moved from thecooling stage 230 to the wafer carrier in the load lock chamber 220, theprocessed wafers 222 are cooled in the load lock chamber 220.Specifically, the load lock chamber 220 may be the chamber 100 of FIG. 1to FIG. 3, and include the cooling pipe 120 to further cool theprocessed wafers. However, the load lock chamber 220 may also be adifferent chamber than the chamber 100 of FIG. 1 to FIG. 3, and alsocool the processed wafers 222 through heat dissipation or a differentcooling pipe.

In some embodiments, in step S102, the processed wafer 222 is retrievedby the interface robot 212 of the central transfer chamber 210 from theprocessing module 242. In step S104, the interface robot 212 of thecentral transfer chamber 210 places the processed wafer 222 onto thecooling stage 230. In step S106, the interface robot 212 of the centraltransfer chamber 210 moves the processed wafer 222 from the coolingstage 230 into the wafer carrier disposed in the load lock chamber 220.However, processed wafer 222 may be moved through any suitable method bythe user in steps S102 to S106. The disclosure is not limited thereto.

According to some embodiments, a semiconductor processing stationincludes a first chamber, a second chamber, and a cooling stage. Thesecond chamber includes a cooling pipe and an external pipe. The coolingpipe is disposed inside the second chamber and includes a first segmentand a second segment. The first segment is disposed along a sidewall ofthe second chamber, and the second segment is disposed perpendicular tothe first segment and located above a wafer carrier in the secondchamber, where an end of the second segment is connected to an end ofthe first segment. The external pipe is connected to the second segmentdistal from the end of the second segment to provide a fluid to flowthrough the cooling pipe from an exterior of the second chamber to aninterior of the second chamber, where the fluid is discharged towardsthe wafer carrier through the first segment. The first chamber issurrounded by the second chamber and the cooling stage, and the firstchamber communicates between the cooling stage and the second chamber.

According to some embodiments, a semiconductor processing stationincludes a plurality of chambers communicating with one another, a loadport, and a processing module. At least one of the chambers includes acooling pipe disposed inside the at least one of the chambers and anexternal pipe extending from outside the at least one of the chambers toinside the at least one of the chambers. The cooling pipe includes amain segment disposed horizontally at a top of the at least one of thechambers and a first segment connected to the main segment and disposedvertically along the at least one of the chambers. The external pipeconnected to the main segment provides a fluid to flow through the mainsegment and output the fluid by the main segment and the first segment.The load port and the processing module are disposed at two opposingsides of the at least one of the chambers and communicate with the atleast one of the chambers.

According to some embodiments, a semiconductor processing station forprocessing a wafer includes a load lock chamber, a load port, and aprocessing module. The load lock chamber includes a wafer carrier and apipe. The pipe includes a main segment, an external segment, and avertical segment. The main segment and the external segment are disposedabove the wafer carrier and in fluid communication with each other, andthe external segment laterally passes through a sidewall of the loadlock chamber to flow a fluid from an exterior of the load lock chamberto an interior of the load lock chamber. The vertical segment is influid communication with the main segment and disposed aside the wafercarrier along the sidewall of the load lock chamber to laterally outputthe fluid to different parts of the wafer carrier. The load port and theprocessing module are disposed at two opposing sides of the load lockchamber, and the wafer to be processed is transferred from the load lockchamber to the processing module.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A semiconductor processing station comprising: afirst chamber; a second chamber, comprising: a cooling pipe, disposedinside the second chamber, and the cooling pipe comprising: a firstsegment, disposed along a sidewall of the second chamber; and a secondsegment, disposed perpendicular to the first segment and located above awafer carrier in the second chamber, wherein an end of the secondsegment is connected to an end of the first segment; and an externalpipe, connected to the second segment distal from the end of the secondsegment to provide a fluid to flow through the cooling pipe from anexterior of the second chamber to an interior of the second chamber,wherein the fluid is discharged towards the wafer carrier through thefirst segment; and a cooling stage, wherein the first chamber issurrounded by the second chamber and the cooling stage, and the firstchamber communicates between the cooling stage and the second chamber.2. The semiconductor processing station as claimed in claim 1, whereinthe first segment comprises a plurality of purge nozzles evenlydistributed thereon.
 3. The semiconductor processing station as claimedin claim 1, wherein the cooling pipe of the second chamber furthercomprises: a third segment, connected to the second segment and oppositeto the first segment, wherein the first segment and the third segmentare disposed adjacent to different sides of the second chamber.
 4. Thesemiconductor processing station as claimed in claim 3, wherein a firstpurge nozzle of the first segment of the cooling pipe, a second purgenozzle of the second segment of the cooling pipe, and a third purgenozzle of the third segment of the cooling pipe face inwards and awayfrom the sidewall of the second chamber.
 5. The semiconductor processingstation as claimed in claim 1, further comprising: a platform disposedadjacent to the first chamber, the platform comprising a plurality ofprocessing modules.
 6. The semiconductor processing station as claimedin claim 5, wherein the first chamber communicates among the processingmodules, the cooling stage, and the second chamber.
 7. The semiconductorprocessing station as claimed in claim 6, wherein the wafer carriercomprises a wafer, the first chamber comprises an interface robot movingaround in the first chamber, and the interface robot transfers the waferto one of the processing modules, the cooling stage and the secondchamber.
 8. The semiconductor processing station as claimed in claim 1,further comprising: an equipment front end module, disposed aside thesecond chamber and opposite to the first chamber, wherein the equipmentfront end module comprises an interface module and a load port, theinterface module communicates between the load port and the secondchamber.
 9. A semiconductor processing station comprising: a pluralityof chambers communicating with one another, at least one of the chamberscomprising: a cooling pipe, disposed inside the at least one of thechambers and comprising: a main segment, disposed horizontally at a topof the at least one of the chambers; and a first segment, connected tothe main segment and disposed vertically along the at least one of thechambers; and an external pipe, extending from outside the at least oneof the chambers to inside the at least one of the chambers, wherein theexternal pipe connected to the main segment provides a fluid to flowthrough the main segment and output the fluid by the main segment andthe first segment; and a load port and a processing module disposed attwo opposing sides of the at least one of the chambers and communicatingwith the at least one of the chambers.
 10. The semiconductor processingstation as claimed in claim 9, wherein the cooling pipe furthercomprises: a second segment, connected to the main segment opposite tothe first segment and disposed parallel to the first segment.
 11. Thesemiconductor processing station as claimed in claim 9, wherein a firstpurge nozzle of the first segment of the cooling pipe and a main purgenozzle of the main segment of the cooling pipe face inwards and awayfrom a sidewall of the at least one of the chambers.
 12. Thesemiconductor processing station as claimed in claim 9, furthercomprising: a cooling stage disposed adjacent to the chambers, whereinthe at least one of the chambers communicates between the cooling stageand another one of the chambers to transfer a wafer between the coolingstage and the at least one of the chambers.
 13. The semiconductorprocessing station as claimed in claim 9, further comprising: anequipment front end module, disposed aside the at least one of thechambers, wherein the equipment front end module comprises an interfacemodule and a load port, the interface module communicates between theload port and the at least one of the chambers.
 14. The semiconductorprocessing station as claimed in claim 9, further comprising: aninterface robot disposed between the chambers and the processing moduleand configured to transfer a wafer to one of the processing module andthe chambers.
 15. A semiconductor processing station for processing awafer, the semiconductor processing station comprising: a load lockchamber, comprising a wafer carrier and a pipe, the pipe comprising: amain segment and an external segment, disposed above the wafer carrierand in fluid communication with each other, the external segmentlaterally passing through a sidewall of the load lock chamber to flow afluid from an exterior of the load lock chamber to an interior of theload lock chamber; and a vertical segment, in fluid communication withthe main segment and disposed aside the wafer carrier along the sidewallof the load lock chamber to laterally output the fluid to differentparts of the wafer carrier; and a load port and a processing module,disposed at two opposing sides of the load lock chamber, the wafer to beprocessed being transferred from the load lock chamber to the processingmodule.
 16. The semiconductor processing station as claimed in claim 15,wherein the main segment and the external segment of the pipe aredisposed along a substantially T-shape in a top view of the load lockchamber.
 17. The semiconductor processing station as claimed in claim15, wherein the fluid flows through the external segment to the mainsegment and discharges downwardly to the wafer carrier.
 18. Thesemiconductor processing station as claimed in claim 15, wherein themain segment and the vertical segment of the pipe are disposed along asubstantially upside-down U-shape in a cross-sectional view of the loadlock chamber.
 19. The semiconductor processing station as claimed inclaim 15, further comprising: a cooling stage disposed between the loadlock chamber and the processing module, the cooling stage equipped witha cooling liquid flowing therethrough.
 20. The semiconductor processingstation as claimed in claim 15, further comprising: an interface robotcommunicating between the load lock chamber and the processing module totransfer the wafer therebetween.